injecţie de defecte
|
LDR | 00085nx j2200049 | |
---|---|---|
001 | 124460 | |
250 | $a injecţie de defecte | |
901 | $a a $b a |
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Simulation Based Reliability Assessment of Quantum Circuits
de:
Boncalo, Oana
(Text tipărit)