injecţie de defecte
|
LDR | 00085nx j2200049 | |
---|---|---|
001 | 124460 | |
250 | $a injecţie de defecte | |
901 | $a a $b a |
Works:
1 works in 1 publications in 1 languages
1 records Page 1 of 1
- 1
Simulation Based Reliability Assessment of Quantum Circuits
by:
Boncalo, Oana
(Language materials, printed)