circuit integrat CMOS subalimentat evaluarea fiabilităţii tehnica defectelor induse eroare probabilitate nivel tranzitor decodor

Topical Subject:	circuit integrat CMOS subalimentat evaluarea fiabilităţii tehnica defectelor induse eroare probabilitate nivel tranzitor decodor

LDR	00194nx j2200049
001	133199
250	$a circuit integrat CMOS subalimentat evaluarea fiabilităţii tehnica defectelor induse eroare probabilitate nivel tranzitor decodor
901	$a a $b a

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Transient Errors Impact Analysis for Sub-Powered CMOS Circuits at Multiple Levels of Abstraction of a Digital System by: Nimară, Sergiu (Language materials, printed)

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