Akazawa, T.
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001 | 662 | |
009 | Akazawa, T. | |
200 | $a Akazawa $b T. | |
801 | 0 $a RO $b UTCB $c 20220428 |
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Pseudo-dynamic Testing Using Conventional Testing Devices
de:
Akazawa, T.; Igarashi, H.; Nakashima, Masayoshi
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